In: IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) Slovak University of Technology in Bratislava, Bratislava, pp. 12-15.
Dual-pixel CMOS APS Architecture for Intra-frame Speed Measurement
In: 30th European Simulation and Modeling Conference - ESM'16 European Multidisciplinary Society for Modelling and Simulation Technology (EUROSIS), Las Palmas, pp. 91-95.
Colored Petri Net Based Diagnosis of Process Systems