In: 19th IMEKO TC10 Conference “MACRO meets NANO in Measurement for Diagnostics, Optimization and Control” Delft, The Netherlands, September 21–22, 2023, Proceedings IMEKO, Delft, pp. 33-38.
Improving the Planning Quality in Practice with Artificial Intelligence
In: RFID Technology Integration for Business Performance Improvement Advances in E-Business Research (Aebr) Book Series IGI Global, Hershey, pp. 121-139.
Meta-data alignment in open Tracking & Tracing systems