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2000

In: 9th international conference and exhibition on power electronics and motion control. EPE - PEMC 2000. Proceedings. Kosice, 2000. Vol. 2. Power converters..

Welding equipment on field without AC Line

Authors
Borka, József
Horváth, Miklós
Editors
Fedák, V
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2000

In: IST mobile communications summit 2000. Proceedings. Galway, 2000..

CAST: Configurable radio with advanced software technology

Authors
Bosch, B.
Honary, B.
Justo, G.
Kovács, József
Lohi, M.
Lund, D.
Madani, K.
Patel, P.
Ramos, R.
Imre, S.
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2000

In: Proceedings of the 6th IEEE international workshop on cellular neural networks and their applications. (CNNA 2000). Catania..

Adaptive image sensing and enhancement using the adaptive cellular neural network universal machine

Authors
Brendel, M.
Roska, Tamás
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2000

In: Proceedings of the 6th IEEE international workshop on cellular neural networks and their applications. (CNNA 2000). Catania.

A qualitative model-framework for spatio-temporal effects in vertebrate retinas

Authors
Bálya, Dávid
Roska, B.
Németh, Erzsébet
Roska, Tamás
Werblin, F.
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2000

In: Workshop on digital control: past, present and future of PID control. PID '00. Preprints.Terrassa, 2000..

A new PID regulator design scheme based on a K-B parametrized closed-loop

Authors
Bányász, Csilla
Keviczky, László
Editors
Quevedo, J
Escobet, T
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2000

In: Project control: the human factor. Proceedings of ESCOM - SCOPE 2000. Munich, 2000..

Cultural environment protection in the information society

Authors
Bíró, M.
Editors
Maxwell, KD
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2000

DISCRETE MATHEMATICS, 219 (13)., pp. 17-26.

Clique covering the edges of a locally cobipartite graph

Authors
Chen, G.
Jacobson, MS
Kézdy, AE
Lehel, Jenő
Scheinerman, ER
Wang, C.
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2000

In: Képfeldolgozók és alakfelismerők 2. konferenciája. (Second conference of the Hungarian Image Processing and Pattern Recognition Society.) Noszvaj, 2000..

Applications of pattern regularity

Authors
Csetverikov, Dmitrij
Editors
Szirányi, T
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2000

IMAGE AND VISION COMPUTING, 18, pp. 975-985.

Pattern regularity as a visual key

Authors
Csetverikov, Dmitrij
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2000

In: 15th international conference on pattern recognition. ICPR-2000. Proceedings. Barcelona, 2000. Vol. 1. Computer vision and image analysis..

Structural defects: general approach and application to textile inspection

Authors
Csetverikov, Dmitrij
Editors
Sanfeliu, A
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